1 - 10 of 34 articles
The principles of the use of line-width relations for the separation of line broadening effects are reviewed and a collection of line-width relations for a number of analytical profile types of practical interest is given.
By the use of the continuous X‐ray spectrum it is possible to determine the polarity of semiconductors of the blende type. Close to the absorption edges, the scattered intensities are different for (111) and () faces.
A computer program has been written which enables an on line graph plotter to construct stereographic projections 30 cm in diameter to an accuracy of 0.1 mm. A complete projection containing 160 poles can be computed and drawn in a few minutes.
Bent-glass mirrors can be used to produce a narrow, highly collimated X-ray beam, particularly suitable for photographing diffraction patterns from crystals with very large unit cells (i.e., several hundred A to a side). A camera is described that employs double-mirror focusing optics with a...
The long range order in a powder sample of Ag3Mg has been studied by X‐ray diffraction as a function of quenching temperature below the critical ordering temperature of 665°K. By measuring the positions and integrated intensities of fundamental, superlattice and satellite reflections, the latter...
A method is described for evaluating the absorption corrections in those cases in which, in addition to the crystal, other objects take part in the absorption. The method has been applied to the high‐pressure cell developed in this laboratory and it has been tested on a set of intensities...
An adapter which supports a Polaroid flat‐plate film holder has been designed for a standard Weissenberg goniometer. A number of applications, including a method for rapidly aligning single crystals, are described.
Formulae are presented to calculate a rotationally symmetrical orientation distribution of a crystallographic direction from the rotationally symmetrical orientation distribution of planes parallel to this direction.
A measured quantity called powder specimen index (P.I.) is defined. This can be used in applied crystallography to monitor the quality of powders having a part in production procedures. Among possible uses the characterization of particle size of powders in single phase or mixtures, the...
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