Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

Optimal design of partially accelerated life tests for the exponential distribution under type-I... http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png IEEE Transactions on Reliability CrossRef

Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

IEEE Transactions on Reliability , Volume 41 (3): 400-406 – Jan 1, 1992

Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

IEEE Transactions on Reliability , Volume 41 (3): 400-406 – Jan 1, 1992

Loading next page...
 
/lp/crossref/optimal-design-of-partially-accelerated-life-tests-for-the-exponential-oWxKd2PnRv

References

References for this paper are not available at this time. We will be adding them shortly, thank you for your patience.

Publisher
CrossRef
ISSN
0018-9529
DOI
10.1109/24.159807
Publisher site
See Article on Publisher Site

Abstract

Journal

IEEE Transactions on ReliabilityCrossRef

Published: Jan 1, 1992

There are no references for this article.