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Unraveling the Resistive Switching Mechanisms in LaMnO3+δ-Based Memristive Devices by Operando Hard X-ray Photoemission Measurements

Unraveling the Resistive Switching Mechanisms in LaMnO3+δ-Based Memristive Devices by Operando... http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png ACS Applied Electronic Materials CrossRef

Unraveling the Resistive Switching Mechanisms in LaMnO3+δ-Based Memristive Devices by Operando Hard X-ray Photoemission Measurements

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Publisher
CrossRef
ISSN
2637-6113
DOI
10.1021/acsaelm.1c00968
Publisher site
See Article on Publisher Site

Abstract

Journal

ACS Applied Electronic MaterialsCrossRef

Published: Nov 17, 2021

References