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This paper considers minimising makespan on a single batch processing machine where jobs have dynamic release time and non-identical sizes in burn-in operation of semiconductor final testing. The machine can process one batch at a time as long as its capacity is not exceeded. The processing time of a batch equals to the longest processing time of all jobs in that batch. The problem is proven to be NP-hard and hence a hybrid Ant Colony Optimisation (ACO) method was proposed combined with Dynamic Programming (DP) technique. Computational results show that the joint ACO+DP approach performs considerably well on all instances. (Received 9 April 2009; Revised 27 June 2009; Accepted 13 October 2009)
International Journal of Manufacturing Research – Inderscience Publishers
Published: Jan 1, 2010
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