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A method for determining stresses in single crystals by X-ray diffraction

A method for determining stresses in single crystals by X-ray diffraction A method for determining the stresses in single crystals similar to that generally used for polycrystalline samples is described. The method for single crystals is more complicated because of the need for accurate alignment and consideration of anisotropic elastic constants. Means for calculating and compensating for alignment errors are included. Stress values determined by this method are compared with those determined by other independent means. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography International Union of Crystallography

A method for determining stresses in single crystals by X-ray diffraction

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A method for determining stresses in single crystals by X-ray diffraction

Pan, S; Weil, R
Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography , Volume 27 (6): 578 – Nov 1, 1971

Abstract

A method for determining the stresses in single crystals similar to that generally used for polycrystalline samples is described. The method for single crystals is more complicated because of the need for accurate alignment and consideration of anisotropic elastic constants. Means for calculating and compensating for alignment errors are included. Stress values determined by this method are compared with those determined by other independent means.

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1971 International Union of Crystallography
ISSN
0567-7394
DOI
10.1107/S0567739471001293
Publisher site
See Article on Publisher Site

Abstract

A method for determining the stresses in single crystals similar to that generally used for polycrystalline samples is described. The method for single crystals is more complicated because of the need for accurate alignment and consideration of anisotropic elastic constants. Means for calculating and compensating for alignment errors are included. Stress values determined by this method are compared with those determined by other independent means.

Journal

Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography – International Union of Crystallography

Published: Nov 1, 1971

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