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Intensity errors due to beam inhomogeneity and imperfectly spherical crystals

Intensity errors due to beam inhomogeneity and imperfectly spherical crystals An analysis of the intensity errors from imperfectly spherical crystals with an inhomogeneous incident X- ray beam is presented. The crystals are considered to have either no absorption or strong absorption. The inhomogeneity of the incident beam profile is represented by three possible models: (a) a Lorentzian, (b) a Gaussian and (c) a second-order Taylor series expansion. The results are compared with intensities for electron density studies from five crystals. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography International Union of Crystallography

Intensity errors due to beam inhomogeneity and imperfectly spherical crystals

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Intensity errors due to beam inhomogeneity and imperfectly spherical crystals

Flack, H.D; Vincent, M.G
Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography , Volume 35 (5): 795 – Sep 1, 1979

Abstract

An analysis of the intensity errors from imperfectly spherical crystals with an inhomogeneous incident X- ray beam is presented. The crystals are considered to have either no absorption or strong absorption. The inhomogeneity of the incident beam profile is represented by three possible models: (a) a Lorentzian, (b) a Gaussian and (c) a second-order Taylor series expansion. The results are compared with intensities for electron density studies from five crystals.

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1979 International Union of Crystallography
ISSN
0567-7394
DOI
10.1107/S0567739479001819
Publisher site
See Article on Publisher Site

Abstract

An analysis of the intensity errors from imperfectly spherical crystals with an inhomogeneous incident X- ray beam is presented. The crystals are considered to have either no absorption or strong absorption. The inhomogeneity of the incident beam profile is represented by three possible models: (a) a Lorentzian, (b) a Gaussian and (c) a second-order Taylor series expansion. The results are compared with intensities for electron density studies from five crystals.

Journal

Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography – International Union of Crystallography

Published: Sep 1, 1979

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