Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Methode directe de correction des profils de raies de diffraction des rayons X. I. Methode numerique de deconvolution

Methode directe de correction des profils de raies de diffraction des rayons X. I. Methode... A new method of correction of X-ray powder diffraction line profiles by deconvolution is being developed. The convolution equation, representing the phenomenon of deformation of a true diffraction line profile, is approached with the help of a quadrature formula by a system of linear equations. The bad conditioning of this system has led to the use of a stabilization method enabling one to obtain a result converging to the true solution which satisfies the physical phenomenon. The quadrature formulae which are used are described. This method has been programmed in Fortran II for the IBM 1620. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography International Union of Crystallography

Methode directe de correction des profils de raies de diffraction des rayons X. I. Methode numerique de deconvolution

Methode directe de correction des profils de raies de diffraction des rayons X. I. Methode numerique de deconvolution


Abstract

A new method of correction of X-ray powder diffraction line profiles by deconvolution is being developed. The convolution equation, representing the phenomenon of deformation of a true diffraction line profile, is approached with the help of a quadrature formula by a system of linear equations. The bad conditioning of this system has led to the use of a stabilization method enabling one to obtain a result converging to the true solution which satisfies the physical phenomenon. The quadrature formulae which are used are described. This method has been programmed in Fortran II for the IBM 1620.

Loading next page...
 
/lp/international-union-of-crystallography/methode-directe-de-correction-des-profils-de-raies-de-diffraction-des-vli3UdYvkl
Publisher
International Union of Crystallography
Copyright
Copyright (c) 1969 International Union of Crystallography
ISSN
0567-7394
DOI
10.1107/S0567739469000544
Publisher site
See Article on Publisher Site

Abstract

A new method of correction of X-ray powder diffraction line profiles by deconvolution is being developed. The convolution equation, representing the phenomenon of deformation of a true diffraction line profile, is approached with the help of a quadrature formula by a system of linear equations. The bad conditioning of this system has led to the use of a stabilization method enabling one to obtain a result converging to the true solution which satisfies the physical phenomenon. The quadrature formulae which are used are described. This method has been programmed in Fortran II for the IBM 1620.

Journal

Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General CrystallographyInternational Union of Crystallography

Published: Mar 1, 1969

There are no references for this article.