Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Rontgendiffraktrometrische Parallelanregung von Kristall-Gitterebenen

Rontgendiffraktrometrische Parallelanregung von Kristall-Gitterebenen X-rays with a very small angle of incidence to any reflecting plane, cause Bragg reflexions of the usual type. An explanation, based on the present theory of X-ray diffraction, cannot as yet be given. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography International Union of Crystallography

Rontgendiffraktrometrische Parallelanregung von Kristall-Gitterebenen

Download PDF
Loading next page...
 
/lp/international-union-of-crystallography/rontgendiffraktrometrische-parallelanregung-von-kristall-gitterebenen-Rtuj8shxqN
Publisher
International Union of Crystallography
Copyright
Copyright (c) 1972 International Union of Crystallography
ISSN
0567-7394
DOI
10.1107/S0567739472000774
Publisher site
See Article on Publisher Site

Abstract

X-rays with a very small angle of incidence to any reflecting plane, cause Bragg reflexions of the usual type. An explanation, based on the present theory of X-ray diffraction, cannot as yet be given.

Journal

Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography – International Union of Crystallography

Published: May 1, 1972

There are no references for this article.