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The resolution function of a slow neutron rotating-crystal time-of-flight spectrometer. I. Application to phonon measurements

The resolution function of a slow neutron rotating-crystal time-of-flight spectrometer. I.... The resolution function of a slow neutron rotating crystal time-of-flight spectrometer applied to phonon measurements is treated analytically. It is demonstrated that every component of the instrument may contribute to the uncertainty of the time-of-flight measurement. Focusing conditions are derived leading to the concept of removable and irremovable time-of-flight spreads. No approximations are made concerning the phonon dispersion surface. Experimental evidence is presented to support the resolution functions calculated on the basis of this theory. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography International Union of Crystallography

The resolution function of a slow neutron rotating-crystal time-of-flight spectrometer. I. Application to phonon measurements

The resolution function of a slow neutron rotating-crystal time-of-flight spectrometer. I. Application to phonon measurements


Abstract

The resolution function of a slow neutron rotating crystal time-of-flight spectrometer applied to phonon measurements is treated analytically. It is demonstrated that every component of the instrument may contribute to the uncertainty of the time-of-flight measurement. Focusing conditions are derived leading to the concept of removable and irremovable time-of-flight spreads. No approximations are made concerning the phonon dispersion surface. Experimental evidence is presented to support the resolution functions calculated on the basis of this theory.

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1971 International Union of Crystallography
ISSN
0567-7394
DOI
10.1107/S0567739471001013
Publisher site
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Abstract

The resolution function of a slow neutron rotating crystal time-of-flight spectrometer applied to phonon measurements is treated analytically. It is demonstrated that every component of the instrument may contribute to the uncertainty of the time-of-flight measurement. Focusing conditions are derived leading to the concept of removable and irremovable time-of-flight spreads. No approximations are made concerning the phonon dispersion surface. Experimental evidence is presented to support the resolution functions calculated on the basis of this theory.

Journal

Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General CrystallographyInternational Union of Crystallography

Published: Sep 1, 1971

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