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Use of the Ewald sphere in aligning crystal pairs to produce X-ray moire fringes

Use of the Ewald sphere in aligning crystal pairs to produce X-ray moire fringes One crystal plate can be superposed upon another of the same material to produce observable X-ray moire fringes in the simultaneously diffracted beam transmitted through the plates. During alignment it is necessary to determine, and then minimize, the small difference vector between the acting reciprocal lattice vectors. By rigid rotation of the crystal pair about the mean reciprocal lattice vector the Ewald sphere is caused to make various angles with the difference vector. This vector can then be fully determined by measuring its component normal to the Ewald sphere at two or more settings of the sphere. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography International Union of Crystallography

Use of the Ewald sphere in aligning crystal pairs to produce X-ray moire fringes

Use of the Ewald sphere in aligning crystal pairs to produce X-ray moire fringes


Abstract

One crystal plate can be superposed upon another of the same material to produce observable X-ray moire fringes in the simultaneously diffracted beam transmitted through the plates. During alignment it is necessary to determine, and then minimize, the small difference vector between the acting reciprocal lattice vectors. By rigid rotation of the crystal pair about the mean reciprocal lattice vector the Ewald sphere is caused to make various angles with the difference vector. This vector can then be fully determined by measuring its component normal to the Ewald sphere at two or more settings of the sphere.

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1968 International Union of Crystallography
ISSN
0567-7394
DOI
10.1107/S0567739468000343
Publisher site
See Article on Publisher Site

Abstract

One crystal plate can be superposed upon another of the same material to produce observable X-ray moire fringes in the simultaneously diffracted beam transmitted through the plates. During alignment it is necessary to determine, and then minimize, the small difference vector between the acting reciprocal lattice vectors. By rigid rotation of the crystal pair about the mean reciprocal lattice vector the Ewald sphere is caused to make various angles with the difference vector. This vector can then be fully determined by measuring its component normal to the Ewald sphere at two or more settings of the sphere.

Journal

Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General CrystallographyInternational Union of Crystallography

Published: Jan 23, 1968

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