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Efficient and robust image registration for two-dimensional micro-X-ray fluorescence measurements

Efficient and robust image registration for two-dimensional micro-X-ray fluorescence measurements X-ray fluorescence spectrometry (XRF) is a technique that allows determining non-destructively the composition of elements within a sample. Focussing the excitation X-ray beam to a small spot that is moved in the xy-direction relative to the sample adds lateral information. Such a two-dimensional micro-X-ray fluorescence (2D -XRF) spectrometer for desktop use is commercially available providing a resolution down to approximately 10 m. With a -XRF spectrometer, it is inexpensive to take many scans of the same sample. With super-resolution methods, these can potentially be combined into a higher-resolution image. As a prerequisite, the misalignments of multiple scans (shifts and rotation) in the subpixel range have to be detected. We present a method for image registration of multiple images based on expander graphs that provides adjustable tradeoffs between registration quality and running time. We evaluate the algorithms on artificial and real -XRF data and we argue that our findings show that subpixel information is present in real -XRF data. This is a necessary condition for the applicability of multi-image super-resolution techniques to -XRF data in future work. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Analytical Atomic Spectroscopy Royal Society of Chemistry

Efficient and robust image registration for two-dimensional micro-X-ray fluorescence measurements

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Publisher
Royal Society of Chemistry
Copyright
This journal is © The Royal Society of Chemistry
ISSN
0267-9477
eISSN
1364-5544
DOI
10.1039/d2ja00347c
Publisher site
See Article on Publisher Site

Abstract

X-ray fluorescence spectrometry (XRF) is a technique that allows determining non-destructively the composition of elements within a sample. Focussing the excitation X-ray beam to a small spot that is moved in the xy-direction relative to the sample adds lateral information. Such a two-dimensional micro-X-ray fluorescence (2D -XRF) spectrometer for desktop use is commercially available providing a resolution down to approximately 10 m. With a -XRF spectrometer, it is inexpensive to take many scans of the same sample. With super-resolution methods, these can potentially be combined into a higher-resolution image. As a prerequisite, the misalignments of multiple scans (shifts and rotation) in the subpixel range have to be detected. We present a method for image registration of multiple images based on expander graphs that provides adjustable tradeoffs between registration quality and running time. We evaluate the algorithms on artificial and real -XRF data and we argue that our findings show that subpixel information is present in real -XRF data. This is a necessary condition for the applicability of multi-image super-resolution techniques to -XRF data in future work.

Journal

Journal of Analytical Atomic Spectroscopy – Royal Society of Chemistry

Published: Mar 24, 2023

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