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Adaptive technology of the sampling of noise-corrupted signals

Adaptive technology of the sampling of noise-corrupted signals It is shown that, for certain industrial objects, the range of the spectrum of technical parameters can vary in time depending on the operating regime, the environment, the raw material properties, the appearance of defects which can appear, and other operating conditions. A technology that makes it possible to adapt the sampling step to the spectrum of the signal range is proposed. This technology accounts for the metrological parameters of analog-to-digital converters used for this purpose. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Automatic Control and Computer Sciences Springer Journals

Adaptive technology of the sampling of noise-corrupted signals

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Publisher
Springer Journals
Copyright
Copyright © 2008 by Allerton Press, Inc.
Subject
Computer Science; Control Structures and Microprogramming
ISSN
0146-4116
eISSN
1558-108X
DOI
10.1007/s11950-008-1003-3
Publisher site
See Article on Publisher Site

Abstract

It is shown that, for certain industrial objects, the range of the spectrum of technical parameters can vary in time depending on the operating regime, the environment, the raw material properties, the appearance of defects which can appear, and other operating conditions. A technology that makes it possible to adapt the sampling step to the spectrum of the signal range is proposed. This technology accounts for the metrological parameters of analog-to-digital converters used for this purpose.

Journal

Automatic Control and Computer Sciences – Springer Journals

Published: Apr 18, 2008

References

  • Méthodes et téchniques en traitement du signal et applications aux mesures physiques
    Max, J.
  • Random Data: Analysis and Measurement Processing
    Bendat, J.S.; Piersol, A.G.
  • Eksperimental’nyi Analiz
    Aliev, T.A.
  • Structural Integrity Monitoring
    Collacott, R.A.
  • Robust Technology with Analysis of Interference in Signal Processing
    Aliev, T.A.
  • Digital Noise Monitoring of Defect Origin
    Aliev, T.A.