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Automatic Generation of Combinatorial Test DataOne Test at a Time

Automatic Generation of Combinatorial Test Data: One Test at a Time [This chapter presents the one-test-at-a-time algorithms for finding covering arrays. These algorithms generate the test suite in a greedy manner: test cases are generated one by one, until the coverage requirement is met, while each newly-generated test case covers as many uncovered target combinations as possible. Compared to other approaches, the one-test-at-a-time algorithms are more flexible to deal with various kinds of special test requirements, whoever the strategy brings some limitations on finding smaller test suites.] http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png

Automatic Generation of Combinatorial Test DataOne Test at a Time

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Publisher
Springer Berlin Heidelberg
Copyright
© The Author(s) 2014
ISBN
978-3-662-43428-4
Pages
27 –39
DOI
10.1007/978-3-662-43429-1_3
Publisher site
See Chapter on Publisher Site

Abstract

[This chapter presents the one-test-at-a-time algorithms for finding covering arrays. These algorithms generate the test suite in a greedy manner: test cases are generated one by one, until the coverage requirement is met, while each newly-generated test case covers as many uncovered target combinations as possible. Compared to other approaches, the one-test-at-a-time algorithms are more flexible to deal with various kinds of special test requirements, whoever the strategy brings some limitations on finding smaller test suites.]

Published: Sep 16, 2014

Keywords: Target Combinations; Complete Test Suite; Automatic Efficient Test Generator (AETG); Candidate Test Case; Parameter-value Pairs

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