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From scientific instrument to industrial machineApplications in Automated Microscopy

From scientific instrument to industrial machine: Applications in Automated Microscopy [Automation of measurements and automatic analysis of samples on a transmission electron microscope enables a large variety of new microscopy applications suited for industrial needs. The consequences of these new possibilities are profound. The current methods for performing measurements and analysis should be considered carefully in order to find the optimal procedures and conditions needed to deliver the required accuracy or throughput. This chapter shows how to design an automated microscopy application using a model-based approach for one specific application, viz. the size analysis of a mixture of particles.] http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png

From scientific instrument to industrial machineApplications in Automated Microscopy

Part of the SpringerBriefs in Electrical and Computer Engineering Book Series
Editors: Doornbos, Richard; van Loo, Sjir
Doornbos, Richard; van Loo, Sjir
From scientific instrument to industrial machine — Apr 28, 2012
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9 pages

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Publisher
Springer Netherlands
Copyright
© The Author(s) 2012
ISBN
978-94-007-4146-1
Pages
53 –61
DOI
10.1007/978-94-007-4147-8_5
Publisher site
See Chapter on Publisher Site

Abstract

[Automation of measurements and automatic analysis of samples on a transmission electron microscope enables a large variety of new microscopy applications suited for industrial needs. The consequences of these new possibilities are profound. The current methods for performing measurements and analysis should be considered carefully in order to find the optimal procedures and conditions needed to deliver the required accuracy or throughput. This chapter shows how to design an automated microscopy application using a model-based approach for one specific application, viz. the size analysis of a mixture of particles.]

Published: Apr 28, 2012

Keywords: Microscopy application; Particle sizing; Particle detection; Experiment design

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