Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Assigning Patents to Industries: Tests of the Yale Technology Concordance

Assigning Patents to Industries: Tests of the Yale Technology Concordance We describe a method to predict patent counts disaggregated by industry, using available data on patenting by technology field. This method—the Yale Technology Concordance (YTC)—exploits a data set of patents that have been individually assigned by the Canadian Patent Office to both an industry and a technology field. The procedure for predicting patents by industry is developed as a statistical model so that the standard errors of the predictions can be estimated. The YTC is tested on several subsets of Canadian patents by comparing out-of-sample predictions with industry assignments made by the Canadian Patent Office. We find that the predictions of patents by industry are quite accurate for the subset of patents form US inventors. The prediction errors are much greater for the subset of patents granted or published after 1989. This suggests that the relationship between the technology fields and industries has shifted in a way that the procedure does not capture. Nonetheless, predictions from the YTC do appear to give a reasonably accurate picture of the pattern of patenting by industry. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Economic Systems Research Taylor & Francis

Assigning Patents to Industries: Tests of the Yale Technology Concordance

Economic Systems Research , Volume 9 (2): 16 – Jun 1, 1997
15 pages

Loading next page...
 
/lp/taylor-francis/assigning-patents-to-industries-tests-of-the-yale-technology-B0uKz8aW20

References (8)

Publisher
Taylor & Francis
Copyright
Copyright Taylor & Francis Group, LLC
ISSN
1469-5758
eISSN
0953-5314
DOI
10.1080/09535319700000011
Publisher site
See Article on Publisher Site

Abstract

We describe a method to predict patent counts disaggregated by industry, using available data on patenting by technology field. This method—the Yale Technology Concordance (YTC)—exploits a data set of patents that have been individually assigned by the Canadian Patent Office to both an industry and a technology field. The procedure for predicting patents by industry is developed as a statistical model so that the standard errors of the predictions can be estimated. The YTC is tested on several subsets of Canadian patents by comparing out-of-sample predictions with industry assignments made by the Canadian Patent Office. We find that the predictions of patents by industry are quite accurate for the subset of patents form US inventors. The prediction errors are much greater for the subset of patents granted or published after 1989. This suggests that the relationship between the technology fields and industries has shifted in a way that the procedure does not capture. Nonetheless, predictions from the YTC do appear to give a reasonably accurate picture of the pattern of patenting by industry.

Journal

Economic Systems ResearchTaylor & Francis

Published: Jun 1, 1997

Keywords: Patents; Yale Technology Concordance; industry classzjication; Canada

There are no references for this article.