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Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices

Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Advanced Theory and Simulations Wiley

Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices

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Publisher
Wiley
Copyright
© 2021 Wiley‐VCH GmbH
eISSN
2513-0390
DOI
10.1002/adts.202100092
Publisher site
See Article on Publisher Site

Abstract

Journal

Advanced Theory and Simulations – Wiley

Published: Aug 1, 2021

Keywords: ; ;

References

  • Ageing of Integrated Circuits. Causes, Effects and Mitigating Techniques
    Duan, S.; Zwolinski, M.; Halak, B.
  • Handbook of Systems Engineering and Management
    Pecht, M.
  • Handbook of Reliability Engineering
    Pham, H.
  • Wiley StatsRef: Statistics Reference Online
    Giorgio, M.
  • Statistical Methods for the Analysis of Repeated Measurements
    Davis, C. S.